Morphological Image Operators

Advances in Imaging and Electron Physics, Volume 216, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Contains contributions from leading authorities on the subject matterInforms and updates on the latest developments in the field of imaging and electron physicsProvides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource

1. First principles

Henk J.A.M. Heijmans

2. Complete lattices

Henk J.A.M. Heijmans

3. Operators on complete lattices

Henk J.A.M. Heijmans

4. Operators which are translation invariant

Henk J.A.M. Heijmans

5. Adjunctions, dilations, and erosions

Henk J.A.M. Heijmans

6. Openings and closings

Henk J.A.M. Heijmans

7. Hit-or-miss topology and semi-continuity

Henk J.A.M. Heijmans

8. Discretization

Henk J.A.M. Heijmans

9. Convexity, distance, and connectivity

Henk J.A.M. Heijmans

10. Lattice representations of functions

Henk J.A.M. Heijmans

11. Morphology for grey-scale images

Henk J.A.M. Heijmans

12. Morphological filters

Henk J.A.M. Heijmans

13. Filtering and iteration

Henk J.A.M. Heijmans