Advances in Imaging and Electron Physics

Advances in Imaging & Electron Physics merges two long-running serials—Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Contributions from leading authorities Informs and updates on all the latest developments in the field

1. Gaussian Beam Propagation in Inhomogeneous Nonlinear Media. Description in Ordinary Differential Equations by Complex Geometrical Optics
   Pawel Berczynski and Slawomir Marczynski
2. Single-Particle Cryo-Electron Microscopy:  Progress, Challenges, and Perspectives for Further Improvement 
   David Agard, Yifan Cheng, Robert M. Glaeser and Sriram Subramaniam
3. Morphological Amoebas and PDEs
   Martin Welk and Michael Breu