Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

1. Derivation of the Reflection Equations for Higher Order Aberrations of Local Wavefronts by Oblique Incidence

G. Esser, W. Becken, W. Müller, P. Baumbach, J. Arasa, D. Uttenweiler

2. Thermal Imaging in Medicine

Lila Iznita Izhar and Maria Petrou

3. Derivation of the Radiative Transfer Equation in a Medium with a Spatially Varying Refractive Index: A Review

Jean-Michel Tualle

4. Imaging Mass Spectrometry – Sample Preparation, Instrumentation and Applications

Kamlesh Shrivas and Mitsutoshi Setou

5. Transformation Optics

Robert T. Thompson and Steven A. Cummer

6. TSEM - A Review of Scanning Electron Microscopy in Transmission Mode and Its Applications

Tobias Klein, Egbert Buhr and Carl Georg Frase

7. Logarithmic Image Processing: Additive Contrast, Multiplicative Contrast and Associated Metrics

M. Jourlina, M. Carr´e, J. Breugnot and M. Bouabdellah