Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Chapter I: Basic Field Equations

Chapter II: Reducible Systems

Chapter III: Basic Mathematical Tools

Chapter IV: The Finite-Difference Method (FDM)

Chapter V: The Finite-Element Method (FEM)

Chapter VI: The Boundary Element Method

Chapter VII: Hybrid Methods

Appendix

Index