X–Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniques

X–Rays in Nanoscience comprehensively explores the use of X–rays in the determination of surface structures by treating spectroscopy, microscopy, and scattering techniques, all of them using different methodology. With nanotechnology becoming increasingly important, this groundbreaking text covers methods that are indispensable for determining the structure of materials, making it an essential resource for analytical chemists, materials scientists, surface chemists, spectroscopists, and polymer chemists.

Spis treści:
Introduction
High Resolution Soft X–Ray Microscopy for Imaging Nanoscale Magnetic Structures and their Spin Dynamics
Advances in Magetization Dynamics Using Scanning Transmission X–Ray Microscopy
Scanning Photoelectron Microscopy for Novel Nanomaterials Characterization
Coherent X–Ray Diffraction Microscopy
Many–Body Interactions in Nanoscale Materials by Angle Resolved Photoemission Spectroscopy
Soft X–Ray Absorption and Emission Spectroscopy in the Studies of Nanomaterials


Nota biograficzna:
Jinghua Guo is a staff scientist of Advanced Light Source at Lawrence Berkeley National Laboratory. Having obtained his academic degrees from Zehjiang University, China (BS) and Uppsala University, Sweden (PhD), he spent his career working as faculty member in Uppsala University before taking up his present appointment at LBNL. Dr. Guo has authored over 140 peer–reviewed scientific publications.