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In–situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science - ISBN 9783527319732

In–situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science

ISBN 9783527319732

Autor: Gerhard Dehm, James M. Howe, Josef Zweck

Wydawca: Wiley

Dostępność: 3-6 tygodni

Cena: 757,05 zł

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ISBN13:      

9783527319732

ISBN10:      

3527319735

Autor:      

Gerhard Dehm, James M. Howe, Josef Zweck

Oprawa:      

Hardback

Rok Wydania:      

2012-04-26

Ilość stron:      

402

Wymiary:      

245x173

Tematy:      

PN

((Biographien aus Proposal))
Gerhard Dehm is the department head of Materials Physics at the Montanuniversität Leoben, Austria, and director of the Erich Schmid Institute of Materials Science from the Austrian Academy of Sciences. Having obtained his academic degrees from the Universities Erlangen–Nürnberg and Stuttgart, he spent most of his career working for the Max Planck Institute of Metals Research in Stuttgart, Germany. In addition, he was a guest scientist at the Technion–Israel, Institute of Technology for two years. Professor Dehm has authored over 120 scientific publications and has received scientific awards from German Society of Materials Science (DGM) and from Styria (Austria) the award for Nanosciences and Nanotechnology.
James M. Howe received a Ph.D. in Materials Science from the University of California, Berkeley, and he is currently a Professor and Director of the Nanoscale Materials Characterization Facility in the Department of Materials Science and Engineering at the University of Virginia. His research emphasizes the application of in–situ high–resolution transmission electron microscope techniques to study the atomic mechanisms and dynamics of transformation interfaces. Dr. Howe has received several awards for his research, including a Senior Research Award from the von Humboldt Foundation (Germany), the Materials Science Research Silver Medal from ASM International, and the TMS Champion H. Mathewson Medal from TMS. Dr. Howe has published over 200 technical papers, two book chapters and two symposium proceedings. He is author of the textbook "Interfaces in Materials" and co–author of the textbook "Transmission Electron Microscopy and Diffractometry of Materials".
Josef Zweck is head of the electron microscopy group at University of Regenburg′s physics faculty. Initially a student of physics in Regensburg, he went to Arizona State University after his diploma degree, working in Prof. Jo hn Cowley′s group for a year. Upon return to Regensburg he established a TEM group, specialized on high resolution imaging with atomic resolution elemental analysis, electron scattering from amorphous alloys and in recent years in imaging of micromagnetic structures in various specimens, combined with in–situ manipulation. He is board member of Germany′s society for electron microscopy (DGE) since 1996, author of far more than 100 scientific publications and referee for numerous scientific journals.


Spis treści:
((short))
Basics
Thermodynamics
Mechanical Properties
Magnetic Properties
Optical Properties
Electronic Properties
Ferroelectric Properties
Soft Matter
((long))
I. Basics
Scanning Electron Microscopy (SEM)
Focused Ion Beam Microscopy (FIB)
Transmission Electron Microscopy (including HRTEM and STEM)
Camera Systems for Dynamic TEM Experiments
II. Thermodynamics
Growth Processes
Melting and Pre–melting
Chemical Reactions and Oxidation
Interface Kinetcs
Formation of Silicides from a–Si and metal layers
Formation of Surface Patterns observed by Reflection Electron Microscopy
III. Mechanical Properties
The FIB Platform
Mechanical Tests in the SEM
Strain Mapping by Image Correlation (SEM to HRTEM)
Dislocation Mechanisms
New Developments: In–situ Nanoindentation, AFM, and STM Experiments in the TEM
IV. Magnetic Properties
Lorentz–Microscopy
Dynamic Observations of Domains, Vortices and of Ultrafast Phenomena by TEM and PEEM
V. Optical Properties
Cathodoluminiscence in SEM and TEM
Optical Properties of Nanotubes
VI. Electronic Properties
EBIC (SEM) and Potential Contrast
Electromigration (SEM, TEM)
VII. Ferroelectric Properties
Ferroelectric Domains
VIII. Soft Matter
Experiments using Wet–cells (SEM, ESEM, biological samples and materials)
Structure Determination of Soft Matter using In–situ Techniques

Nota biograficzna:
Professor Gerhard Dehm is the department head of Materials Physics at the Montanuniversität Leoben, Austria, and director of the Erich Schmid Institute of Materials Science from the Austrian Academy of Sciences. He has authored over 120 scientific publications and has received scientific awards from the German Society of Materials Science (DGM) and from the award for Nanosciences and Nanotechnology from the State of Styria (Austria).
Professor James M. Howe is Director of the Nanoscale Materials Characterization Facility in the Department of Materials Science and Engineering at the University of Virginia (USA). He has received several awards for his research, including a Senior Research Award from the von Humboldt Foundation (Germany), the Materials Science Research Silver Medal from ASM International, and the TMS Champion H. Mathewson Medal from TMS. He has published over 200 technical papers, two book chapters and two symposium proceedings. He is author of the textbook "Interfaces in Materials" and co–author of the textbook "Transmission Electron Microscopy and Diffractometry of Materials".
Professor Josef Zweck is head of the electron microscopy group at the University of Regenburg′s physics faculty (Germany). He is board member of Germany′s society for electron microscopy (DGE) since 1996. he has authored well over 100 scientific publications and is referee for numerous scientific journals.

Okładka tylna:
((Biographien aus Proposal))
Gerhard Dehm is the department head of Materials Physics at the Montanuniversität Leoben, Austria, and director of the Erich Schmid Institute of Materials Science from the Austrian Academy of Sciences. Having obtained his academic degrees from the Universities Erlangen–Nürnberg and Stuttgart, he spent most of his career working for the Max Planck Institute of Metals Research in Stuttgart, Germany. In addition, he was a guest scientist at the Technion–Israel, Institute of Technology for two years. Professor Dehm has authored over 120 scientific publications and has received scientific awards from German Society of Materials Science (DGM) and from Styria (Austria) the award for Nanosciences and Nanotechnology.
James M. Howe received a Ph.D. in Materials Science from the University of California, Berkeley, and he is currently a Professor and Director of the Nanoscale Materials Characterization Facility in the Department of Materials Science and Engineering at the University of Virginia. His research emphasizes the application of in–situ high–resolution transmission electron microscope techniques to study the atomic mechanisms and dynamics of transformation interfaces. Dr. Howe has received several awards for his research, including a Senior Research Award from the von Humboldt Foundation (Germany), the Materials Science Research Silver Medal from ASM International, and the TMS Champion H. Mathewson Medal from TMS. Dr. Howe has published over 200 technical papers, two book chapters and two symposium proceedings. He is author of the textbook "Interfaces in Materials" and co–author of the textbook "Transmission Electron Microscopy and Diffractometry of Materials".
Josef Zweck is head of the electron microscopy group at University of Regenburg′s physics faculty. Initially a student of physics in Regensburg, he went to Arizona State University after his diploma degree, working in Prof. John Cowley′s group for a year. Upon return to Regensburg he established a TEM group, specialized on high resolution imaging with atomic resolution elemental analysis, electron scattering from amorphous alloys and in recent years in imaging of micromagnetic structures in various specimens, combined with in–situ manipulation. He is board member of Germany′s society for electron microscopy (DGE) since 1996, author of far m

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