Handbook of Nanoscopy: 2 Volume Set

This completely revised successor to the Handbook of Microscopy supplies in–depth coverage of all imaging technologies from the optical to the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before going on to cover the materials class by class, analyzing how the different imaging methods can be successfully applied. It covers the latest developments in techniques, such as in–situ TEM, 3D imaging in TEM and SEM, as well as a broad range of material types, including metals, alloys, ceramics, polymers, semiconductors, minerals, quasicrystals, amorphous solids, among others. The total four volumes are equally divided between methods and applications, making this both a reliable reference and handbook for chemists, physicists, biologists, materials scientists and engineers, as well as graduate students and their lecturers.

Spis treści:
I. METHODS
VOL. 1
General Introduction
From the Past to the Future
1. Light Microscopy
Fundamentals of Light Microscopy and Optical Contrasting of Microstructures
Raman and Infrared Spectroscopy
3D Imaging
Near Field Optical Microscopy
2. X–ray Microscopy
Soft X–ray Imaging
X–ray Microtomography
X–ray and Neutron Diffraction Topography
3. Acoustic Microscopy
Scanning Acoustic Microscopy
Photoacoustic Microscopy
Electron Acoustic Microscopy
Scanning Laser Acoustic Microscopy
4. Electron Microscopy: Stationary Beam Methods
Transmission Electron Microscopy
High–resolution Electron Microscopy
Reflection Electron Microscopy
Electron Energy–loss Spectroscopy Imaging
Low–energy Electron Microscopy
Lorentz Microscopy
Electron Holography Methods
In–situ Electron Microscopy
3D Imaging in TEM, SEM
5. Scanning Beam Methods
Scanning Electron Microscopy
Scanning Transmission Electron Microscopy: Z Contrast
Composition Mapping
Imaging Secondary Ion Mass Spectroscopy
VOL. 2
6. Magnetic Methods
NMR Imaging
SEM with Polarization Analysis
Spin–polarized Low–energy Electron Microscopy
7. Emission Methods
Photoelectron Emission Microscopy
Field Emission and Field Ion Microscopy
8. Scanning Point Probe Techniques
General Introduction
Scanning Tunneling Microscopy
Scanning Force Microscopy
Magnetic Force Microscopy
Ballistic Electron Emission Microscopy
9. Image Recording, Handling and Processing
Image Recording in Microscopy
Image Processing
10. Special Topics
Lenseless Imaging
Nanolaboratory
II. APPLICATIONS
VOL. 3
CLASSES OF MATERIALS
Metals and Alloys
Rocks and Minerals
Semiconductors and Semiconducting Devices
Optoelectronic/Spintronic materials
Ferroic Materials
Structural Ceramics
Perovskite–based Materials
Non–periodic Structures and Amorphous Materials
Quasi–crystalline Structures
VOL. 4
CLASSES OF MATERIALS (continued)
Biomaterials
Carbon
Composite Structural Materials
Structure of Polymers and their Monomeric Analogs
Magnetic Materials
Small Particles
Preparation Techniques for TEM
Catalytic Materials and Porous Materials
Nanostructured Materials
SPECIAL TOPICS
Phase Transformations
Specimen Preparation Techniques
Environmental Problems
Thin Film Growth
Quantitative Hyleography

Nota biograficzna:
Gustaaf Van Tendeloo (∗1950) is professor in materials science and head of the EMAT laboratory of the University of Antwerp, and in charge of the NANO Center of Excellence there. He graduated from the University of Antwerp in 1974 and spent most of his career at this university. He has authored over 600 scientific publications in international journals and was invited speaker at over 100 conferences. He was one of the co–editors of the Handbook of Microscopy and memb er of the editorial or advisory boards of nine journals.
Dirk Van Dyck (∗1948) is professor in solid state physics and vice rector for research at the University of Antwerp. He graduated from the University of Antwerp in 1976 and spent his career at this University. He was one of the co–editors of the Handbook of Microscopy and has authored over 200 scientific publications in international journals and was invited speaker at numerous conferences on electron microscopy and image processing.
Stephen J. Pennycook (∗1953) is a Corporate Fellow in the Condensed Matter Sciences Division at Oak Ridge National Laboratory and leader of the Electron Microscopy Group. He graduated from the University of Cambridge in 1975, moving to Oak Ridge National Laboratory in 1982. Pennycook has authored over 250 scientific publications in international journals and was invited speaker at over 100 conferences. He is a recipient of the Materials Research Society Medal and the Thomas Young Medal of the Institute of Physics. He is member of the editorial boards of Journal of Microscopy and Journal of Electron Microscopy.