Autor: Yehuda Ben-Zion; Xiaofei Chen; Haijiang Zhang
Wydawca: Springer
Dostępność: 3-6 tygodni
Cena: 517,65 zł
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ISBN13: |
9783030245207 |
Autor: |
Yehuda Ben-Zion; Xiaofei Chen; Haijiang Zhang |
Oprawa: |
Paperback |
Rok Wydania: |
2019 |
Recent theoretical and technique developments, novel laboratory experiments, dense seismic arrays, and other high quality data sets offer opportunities for advancing significantly the understanding of earthquakes and faults. This volume describes the state-of-the-art in several frontiers in studies of earthquakes and faults. The subjects covered include analysis of earthquake source properties, models of dynamic ruptures and slow slip events, imaging fault zones and the crust, detection of small earthquakes, high-resolution laboratory fracturing experiments, temporal changes of seismic properties, inversions of focal mechanisms to stress and more. The volume will be useful to students and professional researchers from Earth Sciences, Material Sciences, Solid Mechanics and other disciplines, who are interested in properties and processes of earthquakes and faults. Previously published in Pure and Applied Geophysics, Volume 176, Issue 3, 2019
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