Reliability Characterisation of Electrical and Electronic Systems

This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices.

The text describes the reliability behavior of electrical and electronic systems. It takes an empirical scientific approach to reliability engineering to facilitate a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation. After introducing the fundamentals and background to reliability theory, the text moves on to describe the methods of reliability analysis and charactersation across a wide range of applications.

Takes a holistic approach to reliability engineeringLooks at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliabilityFacilitates a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation

1 Introduction
Jonathan Swingler, Heriot-Watt University, UK
2 Reliability and stupidity: mistakes in reliability engineering and how to avoid them
Albertyn Barnard, Lambda Consulting, South Africa
3 Physics-of-failure methodology for electronics reliability
Michael Pecht, Christopher Hendricks, Elviz George and Michael Osterman, University of Maryland, USA
4 Modern instruments for characterising degradation in electrical and electronic systems 
Paul Goodman, R. Skipper & Nick Aitken, ERA Tech., UK
5 Reliability building of discrete electronic components
Titu I. Bajenescu, La Conversion, Switzerland
6 Reliability of optoelectronics
Jia-Sheng Huang, Emcore, USA
7 Reliability of silicon integrated circuits
Anthony Oates, TSMC, Taiwan
8 Reliability of emerging nano-devices
Nagarajan Raghavan, Singapore University of Technology & Design (SUTD), Singapore & Kin Leong Pey, SUTD, Singapore
9 Design considerations for reliable embedded systems
Bashir M. Al-Hashimi & Rishad Shafik, University of Southampton, UK
10 Reliability approaches for automotive electronic systems
Dina Medhat, Mentor Graphics, Egypt
11 Reliability modeling and accelerated life-testing for solar power generation systems
Fred Schenkelberg, FMS Reliability, USA