Next Generation HALT and HASS: Robust Design of Electronics and Systems

  Next Generation HALT and HASS presents a major paradigm shift from reliability prediction–based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics–of–failure–based robust product and process development methodology.   The new methodologies challenge misleading and sometimes costly mis–application of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. The book helps engineers employ HALT and HASS by illustrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight to the techniques. The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardware–software interactions in digital systems.  The use of empirical operational stress limits for the development of future tools and reliability discriminators is described.    Key features: ∗ Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability. ∗ Challenges existing failure prediction methodologies by highlighting their limitations using real field data. ∗ Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems. ∗ Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits. ∗ Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS. ∗ Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process.

Kirk A. Gray, Accelerated Reliability Solutions, L.L.C., Colorado, USA
Kirk Gray has over thirty two years of experience in the electronics manufacturing industry. He began his career in electronics at the semiconductor level and followed the manufacturing process as a through systems level testing. Kirk Gray worked closely with the inventor techniques of Highly Accelerated Life Test (HALT) and Highly Accelerated Stress Screening (HASS) first at Storage Technology and later at Qualmark. a HALT and HASS chamber manufacturer.  From 2003 until 2010, Kirk was a Sr. Reliability Engineer at Dell, Inc. where he architected and implemented the HALT to HASA process for OEM suppliers of power supplies. He is a charter member and past chairman of the IEEE/CPMT Technical Committee on Accelerated Stress Testing and Reliability and is a senior member of the IEEE. He is a Senior Collaborator with The University of Maryland s CALCE Consortium and currently Principal Consultant at Accelerated Reliability Solutions, L.L.C.

John J. Paschkewitz, Reliability Consultant, Missouri, USA
John J. Paschkewitz has extensive experience in product assurance engineering and management for both new product development and sustaining engineering across multiple industries and products from both an OEM and supplier perspective. Registered Professional Engineer (P.E.) and ASQ Certified Reliability Engineer (CRE). His specialties are as follows:Product Assurance, Reliability Test and Analysis, Verification and Qualification Testing, HALT and HASS, Accelerated Testing, Design for Reliability, and Sustaining Engineering.