Scanning Probe Microscopy¿in Industrial Applications: Nanomechanical Characterization

Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others. Scanning Probe Microscopy for Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. Several chapters include worked examples of useful calculations such as using Hertz mechanics with and without adhesion to model a contact, step-by-step instructions for simulations to guide cantilever selection for an experiment, and data analysis procedures for dynamic contact experiments. The second half of the book describes applications of nanomechanical characterization in industry, including: New formulation development for pharmaceuticals Measurement of critical dimensions and thin dielectric films in the semiconductor industry Effect of humidity and temperature on biomaterials Characterization of polymer blends to guide product formulation in the chemicals sector Unraveling links between food structure and function in the food industry Contributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R&D problems. By explaining the fundamentals before advancing to applications, Scanning Probe Microscopy for Industrial Applications offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R&D efforts.

Preface and Acknowledgements Chapter 1 Overview of Atomic Force Microscopy Chapter 2 Understanding the tip–sample contact: an overview of contact mechanics from the macro to the nanoscale Chapter 3: understanding surface forces using static and dynamic approach/retraction curves Chapter 4: Phase Imaging Chapter 5: Dynamic contact AFM methods for nanomechanical properties Chapter 6: Best Practices in AFM Imaging Chapter 7: Nanoindentation measurements of Mechanical properties of very thin films and nanostructured materials at high spatial resolution Chapter 8: SPM for Critical Measurements in the Semiconductor Industry Chapter 9: SPM for Polymer Applications in the Chemicals Industry Chapter 10: Unravelling links between food structure and function with probe microscopy Chapter 11: Microcantilever Sensors For Petrochemical Applications Chapter 12: Applications of SPM in cosmetic Science Chapter 13: Applications of Scanning Probe Microscopy and Nanomechanical Analysis in Pharmaceutical Development Chapter 14: A comparative nanomechanical study of multiharmonic force microscopy and nanoindentation on low dielectric constant materials Chapter 15: Nanomechanical Characterization of Biomaterial Surfaces: polymer coatings that elute drugs

DALIA G. YABLON, PhD, developed and led a state-of-the-art scanning probe microscopy facility for more than ten years in Corporate Strategic Research, the flagship R&D center of ExxonMobil Corporation. Under her direction, scanning probe microscopy was used to characterize, conduct failure analysis, and probe structure-property relationships across all sectors of the vast petroleum business including areas of polymers, tribology, corrosion, geochemistry, and metallurgy. She currently leads SurfaceChar, a characterization consulting company.