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Surface Analysis – The Principal Techniques - ISBN 9780471972921

Surface Analysis – The Principal Techniques

ISBN 9780471972921

Autor: John C. Vickerman

Wydawca: Wiley

Dostępność: 3-6 tygodni

Cena: 345,45 zł

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ISBN13:      

9780471972921

ISBN10:      

0471972924

Autor:      

John C. Vickerman

Oprawa:      

Paperback

Rok Wydania:      

1997-07-25

Ilość stron:      

474

Wymiary:      

229x155

Tematy:      

PN

In today′s world there are vast areas of materials technology some of which do, and some of which would, benefit from the application of surface analysis techniques in both research and in quality control. In Surface Analysis experts in each analysis area introduce the theory and practice of the principal techniques which have shown themselves to be effective in both basic research and in applied surface analysis. The book brings the reader to a level of knowledge where they can understand data generated by each technique and see how it relates to the type of problems they wish to tackle. The coverage is thorough without being too detailed. Examples of analysis are provided in each case, and review questions at the close of most chapters help the reader to reinforce what has been learnt. Thus the book will be an appropriate text for specialist undergraduate courses in materials analysis and for post–graduate M. Sc. and Ph.D. students in materials and surface science. Industrial analytical scientists will find the book an invaluable introduction to bring rapid familiarity with the capabilities of the various techniques.

Spis treści:
Vacuum Technology for Applied Surface Science (R. Wilson).
Electron Spectroscopy for Chemical Analysis (B. Ratner & D. Castner).
Auger Electron Spectroscopy (H. Mathieu).
Secondary Ion Mass Spectroscopy–the Surface Mass Spectrometry (J. Vickerman & A. Swift).
Low–Energy Ion Scattering and Rutherford Backscattering (E. Taglauer).
Vibrational Spectroscopy from Surfaces (M. Pemble).
Surface Structure Determination by Interference Techniques (W. Flavell).
Scanning Tunnelling Microscopy and Atomic Force Microscopy (G. Leggett).
Index.

Okładka tylna:
In today′s world there are vast areas of materials technology some of which do, and some of which would, benefit from the application of surface analysis techniques in both research and in qua lity control. In Surface Analysis experts in each analysis area introduce the theory and practice of the principal techniques which have shown themselves to be effective in both basic research and in applied surface analysis. The book brings the reader to a level of knowledge where they can understand data generated by each technique and see how it relates to the type of problems they wish to tackle. The coverage is thorough without being too detailed. Examples of analysis are provided in each case, and review questions at the close of most chapters help the reader to reinforce what has been learnt. Thus the book will be an appropriate text for specialist undergraduate courses in materials analysis and for post–graduate M. Sc. and Ph.D. students in materials and surface science. Industrial analytical scientists will find the book an invaluable introduction to bring rapid familiarity with the capabilities of the various techniques.

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