Handbook of Monochromatic XPS Spectra: Polymers and Polymers Damaged by X–Rays

This handbook is one of three containing an invaluable collection of research grade XPS spectra. Each handbook concentrates on a specific family of materials (the elements and their native oxides, semiconductors, and polymers) and is entirely self–contained. The introductory section to each handbook includes comprehensive information about the XPS instruments used, the materials, and the advanced methods of collecting the spectra. Energy resolution settings, instrument characteristics, energy referencing methods, traceability, energy scale calibration details and transmission function are all reported. Among the many valuable features included in each of these handbooks are:
∗ All spectra were measured by using Al—K monochromatic X–rays.
∗ All spectra were collected in a self–consistent manner to maximize data reliability and quality.
∗ All peaks in the wide spectra are fully annotated and accompanied by detailed atom % tables that report BEs for each of the labelled peaks.
∗ Each high–energy resolution spectrum is peak–fitted and accompanied by detailed tables containing binding energies, FWHMs and relative percentages.
In this volume, Polymers and Polymers Damaged by X–rays, are contained XPS spectra from pure polymers and X–ray–induced damage studies of polymers that are valuable when researching the true shape of polymer spectra free of any X–ray– or heat–induced damage. Exclusive features of this volume include:
∗ Vertical and horizontal differential charging effects have been eliminated by using the flood–gun–mesh–screen system
∗ All spectra were obtained under everyday conditions, allowing users to compare directly with in–house spectra
∗ Self–consistent methodology that maximizes reliability and minimizes errors
∗ Overlays of high resolution spectra before and after long–term e xposure to monochromatic X–rays
∗ Valence band spectra of pure polymers which serve as material fingerprints.
This handbook is an invaluable reference for scientists in industry, academia and government laboratories that use XPS spectra in materials science, polymer science and surface science. Also available: Handbook of Monochromatic XPS Spectra: The Elements and Native Oxides Handbook of Monochromatic XPS Spectra: Semiconductors

Spis treści:
ORGANIZATION AND DETAILS OF SPECTRAL SETS.
Alphabetical Organization of Spectra.
Contents of Each Set of Spectra.
Philosophy of Data Collection Methods.
Peak–Fitting (Curve–Fitting) of High Energy Resolution Spectra.
Charge Compensation of Insulating Materials.
Abbreviations Used.
INSTRUMENT AND ANALYSIS DETAILS USED TO MAKE XPS DATA.
Instrument Details.
Experimental Details.
Data Processing Details.
Sample Details.
Energy Resolution Details.
Energy Scale Reference Energies and Calibration Details.
Electron Counting and Instrument Response Function Details (for the X–probe system only).
Effects of Poorly Focusing the Distance between the Sample and the Electron Lens.
Quantitation Details and Choice of ′Sensitivity Exponents′.
Crude Tests of the Reliability of Relative Sensitivity Factors.
Traceability Details.
Reference Papers Describing the Capabilities of X–Probe, M–Probe, and S–Probe XPS Systems.

Nota biograficzna:
B. Vincent Crist XPS International, Ames, Iowa

Okładka tylna:
This handbook is one of three containing an invaluable collection of research grade XPS spectra. Each handbook concentrates on a specific family of materials (the elements and their native oxides, semiconductors, and polymers) and is entirely self–contained. The introductory section to each handbook includes comprehensive information about the XPS instruments used , the materials, and the advanced methods of collecting the spectra. Energy resolution settings, instrument characteristics, energy referencing methods, traceability, energy scale calibration details and transmission function are all reported. Among the many valuable features included in each of these handbooks are:
∗ All spectra were measured by using Al—K monochromatic X–rays.
∗ All spectra were collected in a self–consistent manner to maximize data reliability and quality.
∗ All peaks in the wide spectra are fully annotated and accompanied by detailed atom % tables that report BEs for each of the labelled peaks.
∗ Each high–energy resolution spectrum is peak–fitted and accompanied by detailed tables containing binding energies, FWHMs and relative percentages.
In this volume, Polymers and Polymers Damaged by X–rays, are contained XPS spectra from pure polymers and X–ray–induced damage studies of polymers that are valuable when researching the true shape of polymer spectra free of any X–ray– or heat–induced damage. Exclusive features of this volume include:
∗ Vertical and horizontal differential charging effects have been eliminated by using the flood–gun–mesh–screen system
∗ All spectra were obtained under everyday conditions, allowing users to compare directly with in–house spectra
∗ Self–consistent methodology that maximizes reliability and minimizes errors
∗ Overlays of high resolution spectra before and after long–term exposure to monochromatic X–rays
∗ Valence band spectra of pure polymers which serve as material fingerprints.
This handbook is an invaluable reference for scientists in industry, academia and government laboratories that use XPS spectra in materials science, polymer science and surface science. Also available: Handbook of Monochromatic XPS Spectra: The Elements and Native Oxides Handbook of Monochromatic XPS Spectra: Semiconductors