X–Ray Spectrometry: Recent Technological Advances

During the last decade, remarkable and often spectacular progress has been made in the methodological and instrumental aspects of x–ray spectrometry. This progress includes considerable technological improvements in the design and production of detectors as well as significant advances in x–ray optics, special configurations and computing approaches. All this has resulted in improved analytical performance and new applications, as well as in the perspective of a dramatic enhancement in the potential of x–ray based analysis techniques for the near future.
The book is divided into the following sections:IntroductionX–Ray SourcesX–Ray OpticsX–Ray DetectorsSpecial ConfigurationsNew Computerization MethodsNew Applications
each covering the most advanced and high–tech aspects of the chemical analysis techniques based on x–rays. By its nature, such a book cannot cover the fundamental, well–known and more routine aspects of the technique; for this, reference is made to seve ral existing handbooks and textbooks. Each chapter is prepared by internationally recognized scientists, all of whom are eminent specialists in each of the sub–fields.
This book will assist all analytical chemists and other users of x–ray spectrometry to fully exploit the capabilities of this set of powerful analytical tools and to further expand applications in such fields as material and environmental sciences, medicine, toxicology, forensics, archaeometry and many others.

Spis treści:
Contributors.
Preface.
1 Introduction.
1.1 Considering the Role of X–ray Spectrometry in Chemical Analysis and Outlining the Volume.
2 X–Ray Sources.
2.1 Micro X–ray Sources.
2.2 New Synchrotron Radiation Sources.
2.3 Laser–driven X–ray Sources.
3 X–R ay Optics.
3.1 Multilayers for Soft and Hard X–rays.
3.2 Single Capillaries X–ray Optics.
3.3 Polycapillary X–ray Optics.
3.4 Parabolic Compound Refractive X–ray Lenses.
4 X–Ray Detectors.
4.1 Semiconductor Detectors for (Imaging) X–ray Spectroscopy.
4.2 Gas Proportional Scintillation Counters for X–ray Spectrometry.
4.3 Superconducting Tunnel Junctions.
4.4 Cryogenic Microcalorimeters.
4.5 Position Sensitive Semiconductor Strip Detectors.
5 Special Configurations.
5.1 Grazing–incidence X–ray Spectrometry.
5.2 Grazing–exit X–ray Spectrometry.
5.3 Portable Equipment for X–ray Fluorescence Analysis.
5.4 Synchrotron Radiation for Microscopic X–ray Fluorescence Analysis.
5.5 High–energy X–ray Fluorescence.
5.6 Low–energy Electron Probe Microanalysis and Scanning Electron Microscopy.
5.7 Energy Dispersive X–ray Microanalysis in Scanning and Conventional Transmission Electron Microscopy.
5.8 X–Ray Absorption Techniques.
6 New Computerisation Methods.
6.1 Monte Carlo Simulation for X–ray Fluorescence Spectroscopy.
6.2 Spectrum Evaluation.
7 New Applications.
7.1 X–Ray Fluorescence Analysis in Medical Sciences.
7.2 Total Reflection X–ray Fluorescence for Semiconductors and Thin Films.
7.3 X–Ray Spectrometry in Archaeometry.
7.4 X–Ray Spectrometry in Forensic Research.
7.5 Speciation and Surface Analysis of Single Particles Using Electron–excited X–ray Emission Spectrometry.
Index.

Okładka tylna:
During the last decade, remarkable and often spectacular progress has been made in the methodological and instrumental aspects of x–ray spectrometry. This progress includes considerable technological improvements in the design and production of dete ctors as well as significant advances in x–ray optics, special configurations and computing approaches. All this has resulted in improved analytical performance and new applications, as well as in the perspective of a dramatic enhancement in the potential of x–ray based analysis techniques for the near future.
The book is divided into the following sections:IntroductionX–Ray SourcesX–Ray OpticsX–Ray DetectorsSpecial ConfigurationsNew Computerization MethodsNew Applications
each covering the most advanced and high–tech aspects of the chemical analysis techniques based on x–rays. By its nature, such a book cannot cover the fundamental, well–known and more routine aspects of the technique; for this, reference is made to seve ral existing handbooks and textbooks. Each chapter is prepared by internationally recognized scientists, all of whom are eminent specialists in each of the sub–fields.
This book will assist all analytical chemists and other users of x–ray spectrometry to fully exploit the capabilities of this set of powerful analytical tools and to further expand applications in such fields as material and environmental sciences, medicine, toxicology, forensics, archaeometry and many others.