Optical Shop Testing

This updated Third Edition of the classic textbook is an essential reference for specialists and nonspecialists in the field of optical testing
Since the publication of the Second Edition of this book, many advances have taken place in the field of optical testing. Taking into account the changes in telecommunications, including the various forms of digital networks and their testing aspects, this Third Edition compiles the vast amount of research being conducted in optical engineering into one easily accessible source.
Optical Shop Testing, Third Edition brings together descriptions of all tests carried out in the optical shop that are applicable to optical components and systems. In addition to new chapters and modified material, this revised edition also includes information on:
Testing of aspheric wavefronts, compensators, and null configurations
Zernike polynomial and wavefront fitting
Optical metrology of diffuse objects
Angle, prism, curvature, and focal length measurements
Mathematical representation of an optical surface and its characteristics
Intended for anyone engaged in optical shop testing, this essential textbook also includes a CD–ROM with an exhaustive list of resources and two programs for Windows®, which will be useful when teaching or working in optical testing.

Spis treści:
Preface.
Contributors.
Chapter 1. Newton, Fizeau, and Haidinger Interferometers (M Mantravadi and D Malacara).
1.1 Introduction.
1.2 Newton Interferometer.
1.2.1 Source and Observer’s Pupil Size Considerations.
1.2.2 Some Suitable Light Sources.
1.2.3 Materials for the Optical Flats.
1.2.4 Simple Procedure for Estimating Peak Error.
1.2.5 Measurement of Spherical Surfaces .
1.2.6 Measurement of Aspheric Surfaces.
1.2.7 Measurement of Flatness of Opaque Surfaces.
1.3 Fizeau Interferometer.
1.3.1 The Basic Fizea u Interferometer.
1.3.2 Coherence Requirements for the Light Source.
1.3.3 Quality of Collimation Lens Required.
1.3.4 Liquid Reference Flats.
1.3.5 Fizeau Interferometer with Laser Source.
1.3.6 Multiple–Beam Fizeau Setup.
1.3.7 Testing Nearly Parallel Plates.
1.3.8 Testing the Inhomogeneity of Large Glass or Fused Quartz Samples.
1.3.9 Testing the Parallelism and Flatness of the Faces of Rods, Bars and Plates.
1.3.10 Testing Cube Corner and Right–Angle Prisms.
1.3.11 Fizeau Interferometer for Curved Surfaces.
1.3.12 Testing Concave and Convex Surfaces.
1.4 Haidinger Interferometer.
1.4.1 Applications of Haidinger Fringes.
1.4.2 Use of Laser Source for Haidinger Interferometer.
1.4.3 Other Applications of Haidinger Fringes.
1.5 Absolute Testing of Flats.
Chapter 2. Twyman–Green Interferometer (D Malacara).
2.1 Introduction.
2.2 Beam–Splitter.
2.2.1 Optical Path Difference Introduced by the Beam Splitter Plate.
2.2.2 Required Accuracy in the Beam Splitter Plate.
2.2.3 Cube Beam Splitter.
2.3 Coherence Requirements.
2.3.1 Spatial Coherence.
2.3.2 Temporal Coherence.
2.4 Uses of a Twyman–Green Interferometer.
2.4.1 Testing of Prisms and Diffraction Rulings.
2.4.2 Testing of Lenses.
2.4.3 Testing of Microscope Objectives.
2.5 Compensation of Intrinsic Aberrations in the Interferometer.
2.6 Unequal–Path Interferometer.
2.6.1 Some Special Designs.
2.6.2 Improving the Fringe Stability.
2.7 Open Path Interferometers.
2.7.1 Mach–Zehnder Interferometers.
2.7.2 Triangular Interferometers.
2.7.3 Oblique Incidence Interferometers .
2.8 Variations from the Twyman–Green Configuration.
2.8.1 Interferometers with Diffractive Beam Splitters.
2.8.2 Phase Conjugating Interferometer.
2.9 Typical Interferograms and their Analysis.
2.9.1 Analysis of Interferograms of Arbitrary Wavefronts.
Chapter 3. Com mon–Path Interferometers (D Malacara and S Mallick).
3.1 Introduction.
3.2 Burch′s Interferometer Employing Two Matched Scatter Plates.
3.2.1 Fresnel Zone Plate Interferometer.
3.2.2 Burch and Fresnel Zone Plate Interferometer for Aspheric Surfaces.
3.2.3 Burch and fresnel Zone Plate Interferometers for Phase Shifting.
3.3 Birefringent Beam Splitters.
3.3.1 Savart Polariscope.
3.3.2 Wollaston Prism.
3.3.3 Double–Focus Systems.
3.4 Lateral Shearing Interferometers.
3.4.1 Use of a Savart Polariscope.
3.4.2 Use of a Wollaston Prism.
3.5 Double–Focus Interferometer.
3.6 Saunders′s Prism Interferometer.
3.7 Point Diffraction Interferometer.
3.8 Zernike Tests with Common–Path Interferometers.
3.9 Measurement of the Optical Transfer Function.
Chapter 4. Lateral Shear Interferometers (M Strojnik G Páez and M Mantravadi).
4.1 Introduction.
4.2 Coherence Properties of the Light Source.
4.3 Brief Theory of Lateral Shearing Interferometry.
4.3.1 Interferograms of Spherical and Flat Wavefronts.
4.3.2 Interferogams of Primary Aberrations upon Lateral Shear.
4.4 Evaluation of an Unknown Wavefront.
4.5 Lateral Shearing Interferometers in Collimated Light (White Light Compensated).
4.5.1 Arrangements Based on the Jamin Interferometer.
4.5.2 Arrangements Based on the Michelson Interferometer.
4.5.3 Arrangements Based on a Cyclic Interferometer.
4.5.4 Arrangements Based on the Mach–Zehnder Interferometer.
4.6 Lateral Shearing Interferometers in Convergent Light (White–light Compensated).
4.6.1 Arrangements Based on the Michelson Interferometer.
4.6.2 Arrangements Based on the Mach–Zehnder Interferometer.
4.7 Lateral Shearing Interferometers Using Lasers.
4.7.1 Other Applications of the Parallel Plate Interferometer.
4.8 Other Types of Lateral Shearing Interferometers.
4.8.1 Lateral Shearing Interferometers Ba sed on Diffraction.
4.8.2 Lateral Shearing Interferometers Based on Polarization.
4.9 Vectorial Shearing Interferometer.
4.9.1 Shearing Interferometry.
4.9.2 Directional Shearing Interferometer.
4.9.3 Interferograms of Primary Aberrations upon Vectorial Shear.
4.9.4 Experimental Results.
4.9.5 Similarities and Differences with Other Interferometers.
Chapter 5. Radial, Rotational, and Reversal Shear Interferometer (D Malacara).
5.1 Introduction.
5.2 Radial Shear Interferometers.
5.2.1 Wavefront Evaluation from Radial Shear Interferograms.
5.2.2 Single–Pass Radial Shear Interferometers.
5.2.3 Double–Pass Radial Shear Interferometers.
5.2.4 Laser Radial Shear Interferometers.
5.2.5 Thick–Lens Radial Shear Interferometers.
5.3 Rotational Shear Interferometers.
5.3.1 Source Size Uncompensated Rotational Shear Interferometers.
5.3.2 Source Size Compensated Rotational Shear Interferometer.
5.4 Reversal Shear Interferometers.
5.4.1 Some Reversal Shear Interferometers.
Chapter 6. Multiple–Beam Interferometers (C Roychudhuri).
6.1 Multiple–Beam Fizeau Interferometer.
6.2 Fringes of Equal Chromatic Order.
6.3 Reduction of Fringe Interval in Multiple–Beam Interferometry.
6.4 Plane Parallel Fabry–Perot Interferometer.
6.5 Tolansky Fringes with Fabry–Perot Interferometer.
6.6 Multiple–Beam Interferometer for Curved Surfaces.
Chapter 7. Multiple–Pass Interferometers (P Hariharan).
7.1 Multipass Interferometry.
7.2 Multiple Pass Configurations to Reduce Vibrations.
Chapter 8. Foucault, Wire, and Phase Modulation Tests (J Ojeda–Casta¤eda).
8.1 Introduction.
8.2 Foucault or Knife–Edge Test.
8.2.1 Description.
8.2.2 Geometrical Theory.
8.2.3 Physical Theory.
8.3 Wire Test.
8.3.1 Geometrical Theory.
8.3.2 Physical Theory.
8.4 Platzeck–Gaviola Test.
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