Autor: Bottacchi, StefanoBottacchi, Francesca
Wydawca: Elsevier
Dostępność: 3-6 tygodni
Cena: 919,80 zł
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ISBN13: |
9780323527316 |
Autor: |
Bottacchi, StefanoBottacchi, Francesca |
Oprawa: |
Paperback |
Rok Wydania: |
2017-05-31 |
Tematy: |
TGM |
Theory and Modeling of Cylindrical Nanostructures for High-Resolution Coverage Spectroscopy presents a new method for the evaluation of the coverage distribution of randomly deposited nanoparticles, such as single-walled carbon nanotubes and Ag nanowires over the substrate (oxides, SiO2, Si3N4, glass etc.), through height measurements performed by scanning probe microscopy techniques, like Atomic Force Microscopy (AFM).
The deposition of nanoparticles and how they aggregate in multiple layers over the substrate is one of the most important aspects of solution processed materials determining device performances. The coverage spectroscopy method presented in the book is strongly application oriented and has several implementations supporting advanced surface analysis through many scanning probe microscopy techniques. Therefore this book will be of great value to both materials scientists and physicists who conduct research in this area.
Chapter I – The coverage theory and the Delta model approximation 1. The physical model 2. Simulations 3. The coverage error theory 4. Experimental verification – Part I 5. A model for multiple CNT intersections 6. Generalized coverage theory 7. Experimental verification – Part II 8. Matlab© scripts 9. AFM Measured CNT height density database
Chapter II – Statistical diameter modelling and height density functions 1. The general equation of the height density 2. Deterministic diameter 3. Uniform diameter density 4. Rayleigh diameter density 5. Gaussian-Harmonic (GH) diameter density 6. Measured diameter density 7. Summary of height statistics 8. Gaussian convolution with height densities 9. Comparison among statistical models
Chapter III – The generalized coverage theory and experimental verification 1. Redefining the coverage physical model 2. Coverage solution: “DESIGN mode 3. Coverage solution: MEASURE mode 4. CNTs with random direction 5. Experimental verifications
Chapter IV – The Gaussian-Harmonic model of the substrate height density 1. A new model for the substrate height 2. The Gaussian-Harmonic height density 3. MMSE fitting 4. Application to randomized height densities 5. Measurements of Silver nanowires
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