Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Contributions from leading authorities Informs and updates on all the latest developments in the field

1. Pattern Generators for Reflective Electron-Beam Lithography (REBL)
   Allen M. Carroll
2. Recent Developments in Time-of-Flight Mass Spectrometry
   Frank Gunzer and Jürgen Grotemeyer
3. A Special Voice Transform, Analytic Wavelets, and Zernike Functions
   Margit Pap
4. The Hankel Transform in n-dimensions and Its Applications in Optical Propagation and Imaging
   Colin Sheppard