Autor: Egami, TakeshiBillinge, Simon J.L.
Wydawca: Elsevier
Dostępność: 3-6 tygodni
Cena: 721,35 zł
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ISBN13: |
9780080971339 |
ISBN10: |
0080971334 |
Autor: |
Egami, TakeshiBillinge, Simon J.L. |
Oprawa: |
Hardback |
Rok Wydania: |
2012-11-22 |
Tematy: |
P |
This book focuses on the structural determination of crystalline solids with extensive disorder. Well-established methods exist for characterizing the structure of fully crystalline solids or fully disordered materials such as liquids and glasses, but there is a dearth of techniques for the cases in-between, crystalline solids with internal atomic and nanometer scale disorder. Egami and Billinge discuss how to fill the gap using modern tools of structural characterization. This problem is encountered in the structural characterization of a surprisingly wide range of complex materials of interest to modern technology and is becoming increasingly important.
Takeshi Egami received the 2003 Eugene Bertram Warren Diffraction Physics Award for the work described in the book.
The authors received 2010 J. D. Hanawalt Award from the International Union of Crystallography largely based on the success of this book.
1. Structure of complex materials
2. Crystallographic analysis of complex materials
3. The method of total scattering and atomic pair distribution function analysis
4. Total scattering experiments
5. Data collection and analysis
6. Extracting structural information from the PDF
7. Dynamics of the local structure
8. Structure of well-ordered crystals
9. Defects, nanocrystalline and crystallographically challenged materials
10. Local structure of systems with competing interactions
11. Phase transitions
12. The structure of anisotropic glasses
13. Concluding remarks
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